PB Series High-Low Temperature Reducer | Applied to Low-Temperature Probe Stations

● Side Handwheel

The low-temperature probe station is core equipment for performance testing of semiconductor chips, superconducting materials and precision electronic components. Its internal environment is constantly under ultra-low temperature or alternating high and low temperature working conditions. Ordinary reducers are prone to thermal expansion and contraction deformation, lubrication solidification failure and transmission precision deviation, which seriously affect the accuracy of test data. The high-low temperature reducer, specially developed for extreme wide-temperature working conditions, serves as the core component for precision displacement transmission of low-temperature probe stations. Boasting strong temperature adaptability, the high-low temperature reducer operates stably in the temperature range from -196℃ ultra-low temperature to +200℃ high temperature, resisting rapid temperature alternation. Its gear fit gap remains free of temperature-induced deformation, maintaining ultra-high transmission and positioning accuracy at all times. Equipped with wide-temperature resistant special lubricating medium, the high-low temperature reducer avoids solidification and jamming at ultra-low temperatures and lubricant loss and carbonization at high temperatures, completely solving the common defects of ordinary reducers under variable temperature working conditions. Matching low-temperature probe stations of various models and specifications, the high-low temperature reducer is equipped with full-coverage standardized flange sizes including 42/60/90/100/115/140/180/200/220/255 mm, perfectly adapting to the installation requirements of small scientific research probe stations, medium wafer detection probe stations and large fully automatic mass-production probe stations. The high-low temperature reducer has a gear ratio range of 3 to 100. The small gear ratio realizes micron-level precise fine adjustment of probes to meet precision detection requirements, while the large gear ratio undertakes the overall translation transmission of large-size wafer platforms. With a rated torque range of 5 to 1200 Nm, small-torque high-low temperature reducer models adapt to micro probe modules, and large-torque models match heavy-duty large detection platforms to meet various transmission load demands. The high-low temperature reducer supports dual output modes of shaft output and flange plate output, adapting to different probe station structures such as linear feed and rotary positioning. It is compatible with linear and 90° angle motor installation modes, fitting the compact and closed cavity structure of probe stations. Semiconductor testing equipment requires long-term uninterrupted high and low temperature cycle operation, placing high demands on the temperature change stability of transmission components. The high-low temperature reducer is made of low expansion coefficient alloy materials with minimal thermal expansion and contraction deformation, maintaining stable accuracy without performance attenuation during long-term alternating high and low temperature operation. In scenarios such as third-generation semiconductor low-temperature testing, superconducting material performance detection and wafer high-low temperature reliability testing, the high-low temperature reducer accurately drives probe displacement to ensure the accuracy and consistency of each group of test data. Major equipment manufacturers give priority to the high-low temperature reducer when developing non-standard high-low temperature detection platforms. Its standardized specifications eliminate the need for customized modification and greatly improve equipment R&D efficiency. Under extreme full-temperature-range test working conditions, the high-low temperature reducer has become an indispensable core transmission accessory for low-temperature probe stations by virtue of its excellent temperature resistance and transmission stability.